Artículos SCI

Influence of added thermal resistance on crystallization kinetics, as measured by differential scanning calorimetry (DSC), of the Se70Te30 glass was studied. The increase of thermal resistance was achieved by adding polytetrafluorethylene discs of different thicknesses (up to 0.5 mm) in-between the DSC platform and the pan with sample. Increase of the thermal resistance led to an apparent decrease (by more than 30%) in the crystallization enthalpy. Significant change of model-free kinetics occurred: apparent activation energy E of the crystallization process decreased (by more than 20%) due to the DSC data being progressively shifted to higher temperatures with increasing heating rate. The model-based kinetics was changed only slightly; the DSC peaks retained their asymmetry and the choice of the appropriate model was not influenced by the added thermal resistance. The temperature shift caused by added thermal lag was modeled for the low-to-moderate heating rates.

The main handicap still hindering the eventual exploitation of organometal halide perovskite-based solar cells is their poor stability under prolonged illumination, ambient conditions, and increased temperatures. This article shows for the first time the vacuum processing of the most widely used solid-state hole conductor (SSHC), i.e., the Spiro-OMeTAD [2,2 ',7,7 '-tetrakis (N,N-di-p-methoxyphenyl-amine) 9,9 '-spirobifluorene], and how its dopant-free crystalline formation unprecedently improves perovskite solar cell (PSC) stability under continuous illumination by about two orders of magnitude with respect to the solution-processed reference and after annealing in air up to 200 degrees C. It is demonstrated that the control over the temperature of the samples during the vacuum deposition enhances the crystallinity of the SSHC, obtaining a preferential orientation along the pi-pi stacking direction. These results may represent a milestone toward the full vacuum processing of hybrid organic halide PSCs as well as light-emitting diodes, with promising impacts on the development of durable devices. The microstructure, purity, and crystallinity of the vacuum sublimated Spiro-OMeTAD layers are fully elucidated by applying an unparalleled set of complementary characterization techniques, including scanning electron microscopy, X-ray diffraction, grazing-incidence small-angle X-ray scattering and grazing-incidence wide-angle X-ray scattering, X-ray photoelectron spectroscopy, and Rutherford backscattering spectroscopy.