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Electron Microscopy Service

Scanning Electron Microscopy




Scientific Responsibles
Dr. Asunción Fernández Camacho

Technical Assistant
Dra. Mª Carmen Jiménez de Haro


The scanning electron microscopy provides information about the microstructure, morphology and chemical composition at the microscopic scale of solid samples. It can be applied to all type of materials including ceramics, polymers, metals, minerals, catalysts, samples from cultural heritage, thin films, coatings, interfaces, nanoparticles, etc. The SEM microscope is a field emission cold cathode equipment which enables images of the surface morphology and texture of samples with a resolution of 1 nm at 15kV. It also allows working at low voltages with non-metalized samples and in transmission mode for electron-transparent samples (STEM-in-SEM). Coupled to the X-ray detector (EDX) enables compositional analysis and elemental mapping.

Available Equipment

  • Hitachi S4800 SEM-FEG microscope:  cold cathode field emission gun with voltage from 0.5 to 30 kV, resolution of 1nm at 15 kV. Equipped with a Bruker-X Flash-4010 EDX detector with a resolution of 133 eV (at the MnKα line), and a detector with sample holder to work in transmission mode (STEM-in- SEM).
  • Additional equipment in the “electron microscopy samples preparation laboratory” 

Contact
asuncion@icmse.csic.es
954 48 95 00 ext. 909211




Transmission Electron Microscopy




Scientific Responsibles
Dra. Asunción Fernández Camacho

Technical Assistant
Lda. Olga Montes Amorín, Dª. Inmaculada Rosa Cejudo


The transmission electron microscopy is a widely used technique for the microstructural and chemical characterization at micro and nanoscales, providing two-dimensional images of the sample texture and shape as well as grain and/or particle size, degree of homogeneity at the microscopic scale, degree of crystallinity of the sample, identification of crystalline phases, and high resolution images to identify the crystalline domains. The microscope is equipped with an EDX analyzer for compositional analysis. It can be applied to all type of materials and research topics in materials science and technology working with electron-transparent samples prepared ad-hoc for this end. The service performs transmission electron microscopy: Imaging in bright and dark field, selected area electron diffraction and high resolution electron microscopy, as well as elemental analysis of selected areas. It does not provide STEM mode. 

Available Equipment

  • JEOL 2100Plus microscope (200kV) with LaB6 filament. Structural resolution of 0.14 nm between lines and 0.23 nm between points. Sample holders with one and two angles. An X-ray Energy Dispersive Analyzer (EDX X-Max 80T, Oxford Instruments) and a CCD camera (Gatan) for image registration are attached to the equipment.
  • Additional equipment in the “electron microscopy samples preparation laboratory” 

Contact
asuncion@icmse.csic.es
954 48 95 00 exts. 909215 - 909216




Electron Microscopy Samples Preparation Laboratory




Scientific Responsibles
Dra. Asunciòn Fernández Camacho

Technical Assistant
Dª María Inmaculada Roja Cejudo, Dª Olga Montes Amorín (CicCartuja) , Dra. M. Carmen Jiménez de Haro


The laboratory for TEM and SEM samples preparation has a gold coater, a carbon evaporator, a metallization system for Cr and carbon, a diamond wheel cutter, a grinder with disc-grinder device, an ultrasonic cutter, a concave polishing (dimple) and ion thinning (Fischione 1010).


Contact
asuncion@icmse.csic.es
954 48 95 00 ext. 909216




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